图2. 铬(Cr)胁迫时间序列上谷子叶片中的差异表达基因(DEGs)。A-C, CK、Cr_6h、Cr_6d处理中谷子叶片DEGs火山图。蓝点、红点、灰点分别代表下调、上调和无显著变化基因。D, 不同处理谷子叶片中的DEGs Venn图。E, Cr胁迫下谷子叶片中DEGs的GO注释分析。CK, 对照; Cr_6d, Cr胁迫6 d; Cr_6h; Cr胁迫6 h。FC, 差异表达倍数; p_a, 矫正的p值。

Fig. 2. Differentially expressed genes (DEGs) in leaves of Setaria italica in the chromium (Cr) stress time series. A-C, Volcano plots of DEGs in leaves of S. italica from three sample pairs. The blue, red and gray dots represent down-regulated, up-regulated and no significant change genes, respectively. D, Venn diagram showing the effect of different samples on DEGs in leaves of S. italica. E, GO annotation analysis of DEGs in leaves of S. italica under Cr treatment. CK, control; Cr_6d, Cr stress for 6 d; Cr_6h, Cr stress for 6 h. FC, differential expression multiple; p_a, the adjusted p value.